The effect of film and interface structure on the transport properties of Heusler based current-perpendicular-to-plane spin valves
The effect of film and interface structure on the transport properties of Heusler based current-perpendicular-to-plane spin valves
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DOI:
10.1063/1.3600792
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发表时间:
2011-06
影响因子:
4
通讯作者:
V. Lazarov;Kenta Yoshida;J. Sato;P. Hasnip;M. Oogane;A. Hirohata;Y. Ando
中科院分区:
文献类型:
--
作者:
V. Lazarov;Kenta Yoshida;J. Sato;P. Hasnip;M. Oogane;A. Hirohata;Y. Ando
We present direct link between the transport properties of Co2MnSi and Co2FeMnSi Heusler based current-perpendicular-to-plane spin valves (CPP-SVs) and interface atomic structures resolved by aberration-corrected electron microscopy. The structure of the Co2FeMnSi electrodes is L21 but their interface with the CoSi spacer is disordered. In contrast to the Co2FeMnSi-electrodes, the Co2MnSi-electrodes have abrupt interfaces with the Ag spacer though their ordering is not fully L21. The magnetoresistance of the Co2MnSi-SV is over two orders of magnitude better than those of Co2FeMnSi-SV, demonstrating that the atomic interface ordering is crucial for the enhancement of the magnetoresistance in the Heusler CPP-SVs.