Mechanical Properties of Sharpened Carbon Nanotube Tips
Mechanical Properties of Sharpened Carbon Nanotube Tips
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DOI：
10.1143/jjap.44.1637
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发表时间：
2005-04
影响因子：
1.5
通讯作者：
S. Akita;Masakaki Ohashi;Y. Nakayama
中科院分区：
文献类型：
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作者：
S. Akita;Masakaki Ohashi;Y. Nakayama
我们调查的机械性能的尖锐的纳米管尖端用于扫描探针显微镜的尖端弯曲下的一个力作用在尖端的一侧。通过改进的电击穿工艺制造的尖锐的纳米管探针不仅在形貌测量中而且在电位分布测量中有效地用作具有高横向分辨率的探针。基于对削尖的三壁纳米管探针的分子力学计算，虽然层间范德华相互作用削弱了连续介质模型的基础上预期的探针刚度，但锥形纳米管的刚度被证实是具有相同尖端半径和相同长度的单壁纳米管的刚度的10倍。
We investigate the mechanical properties of sharpened nanotube tips for use in scanning probe microscopy in terms of tip bending under a force acting on the side of the tip. The sharpened nanotube probe fabricated by means of a modified electrical breakdown process effectively acts as a probe with high lateral resolution not only in the topographic measurement but also in the potential distribution measurement. Based on molecular mechanics calculations for a sharpened triple-walled nanotube probe, although the interlayer van-der-Waals interaction weakens the probe stiffness expected on the basis of the continuum model, the stiffness of the tapered nanotube is confirmed to be 10 times higher than that for a single-walled nanotube with the same tip radius and the same length.