Direct observation of crystal defects in an organic molecular crystals of copper hexachlorophthalocyanine by STEM-EELS.
Direct observation of crystal defects in an organic molecular crystals of copper hexachlorophthalocyanine by STEM-EELS.
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DOI：
10.1038/srep00252
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发表时间：
2012
影响因子：
4.6
通讯作者：
Kurata, Hiroki
中科院分区：
文献类型：
--
作者：
Haruta, Mitsutaka;Kurata, Hiroki
对有机薄膜中晶体缺陷的结构分析为其在场效应晶体管等应用中的电子特性提供了基本的见解。基于相衬成像的传统透射电子显微镜已经在相当低的分辨率下观察了有机薄膜中的晶体缺陷。本文首次将环形暗场成像技术应用于六氯眼青铜薄膜的晶界在原子分辨率上的直接观察，采用了像差校正扫描透射电镜结合电子能量损失谱。通过低剂量技术和优化的检测角度，我们能够可视化分子柱内轻元素（C和N）与重元素（Cl和Cu）的对比。我们还能够在沿{110}晶体平面的晶界中发现意想不到的分子取向，从而产生堆积错误。
The structural analysis of crystal defects in organic thin films provides fundamental insights into their electronic properties for applications such as field effect transistors. Observation of crystal defects in organic thin films has previously been performed at rather low resolution by conventional transmission electron microscopy based on phase-contrast imaging. Herein, we apply for the first time annular dark-field imaging to the direct observation of grain boundaries in copper hexachlorophthalocyanine thin films at the atomic resolution level by using an aberration-corrected scanning transmission electron microscope combined with electron energy-loss spectroscopy. By using a low-dose technique and an optimized detection angle, we were able to visualize the contrast of light element (C and N) together with the heavier elements (Cl and Cu) within the molecular column. We were also able to identify unexpected molecular orientations in the grain boundaries along the {110} crystallographic planes giving rise to stacking faults.
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影响因子：
64.8
作者：
Krivanek, Ondrej L.;Chisholm, Matthew F.;Pennycook, Stephen J.
通讯作者：
Pennycook, Stephen J.
影响因子：
64.8
作者：
Batson, PE;Dellby, N;Krivanek, OL
通讯作者：
Krivanek, OL
影响因子：
3.7
作者：
BATSON, PE
通讯作者：
BATSON, PE
影响因子：
41.2
作者：
Ishikawa, Ryo;Okunishi, Eiji;Abe, Eiji
通讯作者：
Abe, Eiji
影响因子：
2.1
作者：
TOKITO, S;SAKATA, J;TAGA, Y
通讯作者：
TAGA, Y