Effect of heat-treatment oxygen partial pressure on the crystal orientation of PZT films prepared by RF magnetron sputtering
Effect of heat-treatment oxygen partial pressure on the crystal orientation of PZT films prepared by RF magnetron sputtering
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热处理氧分压对射频磁控溅射PZT薄膜晶体取向的影响
DOI:
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发表时间:
2004
期刊:
影响因子:
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通讯作者:
H.Miyazaki
中科院分区:
文献类型:
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作者:
H.Miyazaki