Validation of the Ornstein-Uhlenbeck process for load modeling based on µPMU measurements
Validation of the Ornstein-Uhlenbeck process for load modeling based on µPMU measurements
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DOI:
10.1109/pscc.2016.7540898
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发表时间:
2016-06
期刊:
影响因子:
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通讯作者:
C. Roberts;E. Stewart;F. Milano
中科院分区:
文献类型:
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作者:
C. Roberts;E. Stewart;F. Milano
This paper investigates the suitability of the Ornstein-Uhlenbeck process, driven by various Lévy processes, for load modeling at the distribution network level. An indepth description outlining the procedure for estimating the required parameters is given. Both the statistical properties of the simulated processes and its auto-correlation is compared to that of the field measured data to demonstrate the suitability of the proposed methodology. The development of such stochastic models is facilitated by measures obtained from micro-synchrophasors (μPMU's). The data from these devices serves to demonstrate the need to model the volatility along with validating a model attempting to model said volatility.