Structure of quantum dots as seen by excitonic spectroscopy versus structural characterization: Using theory to close the loop
Structure of quantum dots as seen by excitonic spectroscopy versus structural characterization: Using theory to close the loop
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DOI：
10.1103/physrevb.80.165425
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发表时间：
2009-10-01
影响因子：
3.7
通讯作者：
Zunger, A.
中科院分区：
文献类型：
--
作者：
Mlinar, V.;Bozkurt, M.;Zunger, A.
通过对同一量子点样品进行单点光谱和横断面扫描隧道显微镜（XSTM）结构测量，研究了半导体量子点（QDs）中的结构-光谱关系。我们发现使用XSTM结构作为输入计算光谱的传统方法与实测光谱存在明显的冲突。我们展示了一种理论上的“逆方法”，从测量光谱中破译结构信息，并找到与XSTM和光谱数据一致的结构模型。这有效地“闭环”结构和光谱之间的量子点。
Structure-spectra relationship in semiconductor quantum dots (QDs) is investigated by subjecting the same QD sample to single-dot spectroscopy and cross-sectional scanning tunneling microscopy (XSTM) structural measurements. We find that the conventional approach of using XSTM structure as input to calculate the spectra produces some notable conflicts with the measured spectra. We demonstrate a theoretical "inverse approach" which deciphers structural information from the measured spectra and finds structural models that agree with both XSTM and spectroscopy data. This effectively "closes the loop" between structure and spectroscopy in QDs.