Wavelength Sensing With Subpicometer Resolution Using Ultrahigh Order Modes
Wavelength Sensing With Subpicometer Resolution Using Ultrahigh Order Modes
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DOI：
10.1109/jlt.2006.888259
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发表时间：
2007-02
影响因子：
4.7
通讯作者：
Lin Chen;Z. Cao;Q. Shen;Xiaoxu Deng;Fang Ou;Y. Feng
中科院分区：
文献类型：
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作者：
Lin Chen;Z. Cao;Q. Shen;Xiaoxu Deng;Fang Ou;Y. Feng
对称金属包层光波导的三阶模具有很强的波长色散特性，可用于跟踪半导体激光器输出光波长的微小变化。在自由空间耦合的情况下，波长偏移被转换成在波导的表面上反射的光的强度变化。分析了考虑入射光发散角和上包层厚度的灵敏度。实验表明，在中心波长为859.8nm处，波长分辨率为0.5pm
The ultrahigh order modes of a symmetrical metal-cladding optical waveguide, which exhibit strong wavelength dispersion characteristics, are used to track small wavelength changes of the light output of laser diodes. In the case of free-space coupling, the wavelength shift is transformed into an intensity variation of the light reflected on a surface of the waveguide. The sensitivity considering the divergence of the incident light and the thickness of the upper cladding is analyzed. A wavelength resolution of 0.5 pm at a center wavelength of 859.8 nm is demonstrated experimentally