Electron-beam induced electric-hydraulic expansion in a silica-shelled gallium microball-nanotube structure
Electron-beam induced electric-hydraulic expansion in a silica-shelled gallium microball-nanotube structure
复制标题
二氧化硅壳镓微球纳米管结构中的电子束诱导电液膨胀
DOI：
10.1063/1.3625427
复制
发表时间：
2011-08-22
影响因子：
4
通讯作者：
Duan, X. F.
中科院分区：
文献类型：
--
作者：
Gao, Y. H.;Sun, M.;Duan, X. F.
制备了具有异质-异质尺度结构的硅壳化镓微球纳米管。在原位电子束辐照下，观察到镓异常大而快速的膨胀。考虑到带正电的镓离子在Ga微球表面的排斥库仑力所引起的巨大内压，由于电子束的单一常规加热效应，膨胀可以用电液膨胀效应来解释。离子的积累是由于辐照下Ga电子被敲除和硅壳的屏蔽作用阻止了电荷平衡的恢复。提出了一种计算镓离子积累的电路模型。
Heteroshape-heteroscale structure of silica-shelled Ga microball-nanotube was fabricated. Under in situ electron-beam irradiation, an abnormally large and fast expansion of Ga was observed. Failed by a sole routine heating effect of electron-beam, the expansion was explained by an electric-hydraulic expansion effect taking into account a huge inner pressure induced by the repelling Coulomb force of positively charged Ga ions on the Ga microball surface. The ions were accumulated due to knocking-out of Ga electrons under irradiation and shielding effect of a silica shell which prevents the charge balance restoration. A circuit model is proposed to calculate the accumulation of Ga ions.