Scanning Tunneling Microscopy
Scanning Tunneling Microscopy
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DOI：
10.1007/978-94-011-1812-5
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发表时间：
1993-11
期刊：
影响因子：
--
通讯作者：
J. Stroscio;W. Kaiser
中科院分区：
文献类型：
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作者：
J. Stroscio;W. Kaiser
1982年，IBM研究实验室的Binnig、Rohrer、Gerber和Weibel发表了题为”Surface Studies by Scanning Tunnel Mi Rl croscopy”的文章，立即引起了表面科学界的极大兴趣。在参考文献R1中证明，可以简单地通过用锋利的金属尖端扫描表面来获得表面原子结构（如单个台阶）的图像，金属尖端与样品表面保持约10 A的恒定距离。扫描隧道显微镜（STM）中的距离控制是通过一个反馈电路来实现的，该反馈电路利用穿过针尖和样品之间势垒的隧道电流，通过压电XYZ系统来调节针尖的位置。Young等人已经描述了用于确定表面的宏观粗糙度的类似实验方法。IBM小组必须解决一些实验困难，直到这种概念上简单的显微镜方法可以成功地应用于原子分辨率。首先，尖端的距离和扫描控制必须以足够的精度进行操作，以对原子结构敏感。其次，样品保持器和隧穿单元必须以这样的方式设计，即外部振动不会影响样品尖端距离，并且在测量一个图像期间热效应或其他漂移效应变得足够小。
The publication entitled" Surface Studies by Scanning Tunneling Mi Rl croscopy" by Binnig, Rohrer, Gerber and Weibel of the IBM Research Lab oratory in Riischlikon in 1982 immediately raised considerable interest in the sur face science community. It was demonstrated in Reference R1 that images from atomic structures of surfaces like individual steps could be obtained simply by scanning the surface with a sharp metal tip, which was kept in a constant distance of approximately 10 A from the sample surface. The distance control in scanning tunneling microscopy (STM) was realized by a feedback circuit, where the electri cal tunneling current through the potential barrier between tip and sample is used for regulating the tip position with a piezoelectric xyz-system. A similar experi mental approach has already been described by Young et al. for the determination l of the macroscopic roughness of a surface. A number of experimental difficulties had to be solved by the IBM group until this conceptual simple microscopic method could be applied successfully with atomic resolution. Firstly, distance and scanning control of the tip have to be operated with sufficient precision to be sensitive to atomic structures. Secondly, sample holder and tunneling unit have to be designed in such a way that external vibrations do not influence the sample-tip distance and that thermal or other drift effects become small enough during measurement of one image.