Focused ion beam/scanning electron microscopy tomography and conventional transmission electron microscopy assessment of Ni4Ti3 morphology in compression-aged Ni-rich Ni-Ti single crystals
Focused ion beam/scanning electron microscopy tomography and conventional transmission electron microscopy assessment of Ni4Ti3 morphology in compression-aged Ni-rich Ni-Ti single crystals
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DOI：
10.1016/j.scriptamat.2009.11.040
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发表时间：
2010-03-01
影响因子：
6
通讯作者：
Eggeler, Gunther
中科院分区：
文献类型：
--
作者：
Cao, Shanshan;Somsen, Christoph;Eggeler, Gunther
采用聚焦离子束/扫描电子显微镜（FIB/SEM）双束系统对单晶Ni-Ti合金中Ni_4 Ti_3析出相的尺寸、形貌和结构进行了二维透射电子显微镜图像分析和三维重建。虽然颗粒形状和构型数据最好从FIB/SEM获得，但在压缩方向上形成0.54 μ m和垂直于压缩方向1 μ m的B2袋状体（C）2009 Acta Materialia Inc由Elsevier Ltd出版
The size, morphology and configuration of Ni4Ti3 precipitates in a single-crystal Ni-Ti alloy have been investigated by two-dimensional transmission electron microscopy-based image analysis and three-dimensional reconstruction from slice-and-view images obtained in a focused ion beam/scanning electron microscopy (FIB/SEM) dual-beam system Average distances between the precipitates measured along the compression direction correlate well between both techniques, while particle shape and configuration data is best obtained from FIB/SEM Precipitates form pockets of B2 of 0 54 mu m in the compression direction and 1 mu m perpendicular to the compression direction (C) 2009 Acta Materialia Inc Published by Elsevier Ltd All rights reserved