Grain boundary fine structure of ultrananocrystalline diamond thin films measured by Raman scattering
Grain boundary fine structure of ultrananocrystalline diamond thin films measured by Raman scattering
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DOI：
10.1063/1.2757122
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发表时间：
2007-07
影响因子：
4
通讯作者：
M. Veres;S. Tóth;M. Koós
中科院分区：
文献类型：
--
作者：
M. Veres;S. Tóth;M. Koós
利用拉曼光谱研究了不同晶粒度的超纳米金刚石薄膜的晶界结构单元。通过光学显微镜和表面增强拉曼光谱将激发体积限制到晶体尺寸，在这些材料的近红外激发拉曼光谱中检测到了定义明确的分子结构构建块的特征峰。光谱的分析为这些材料的晶界中存在芳香烃和不同的SP3CHX基团提供了证据。
Structural units of the grain boundaries in ultrananocrystalline diamond thin films with different grain sizes were investigated using Raman spectroscopy. Characteristic peaks of well-defined molecular structural building blocks were detected in the near-infrared excited Raman spectra of these materials by limiting the excitation volume to the size of the crystallites using an optical microscope and surface enhanced Raman spectroscopy. The analysis of the spectra provides evidence for the presence of aromatic hydrocarbons and different sp3 CHx groups in grain boundaries of these materials.