Role of Electrical Double Layer Structure in Ionic Liquid Gated Devices
Role of Electrical Double Layer Structure in Ionic Liquid Gated Devices
复制标题
电双层结构在离子液体门控器件中的作用
DOI:
10.1021/acsami.7b11044
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发表时间:
2017-11-22
影响因子:
9.5
通讯作者:
Balke, Nina
中科院分区:
文献类型:
--
作者:
Black, Jennifer M.;Come, Jeremy;Balke, Nina
Ionic liquid gating of transition metal oxides has enabled new states (magnetic, electronic, metal insulator), providing fundamental insights into the physics of strongly correlated oxides. However, despite much research activity, little is known about the correlation of the structure of the liquids in contact with the transition metal oxide surface, its evolution with the applied electric potential, and its correlation with the measured electronic properties of the oxide. Here, we investigate the structure of an ionic liquid at a semiconducting oxide interface during the operation of a thin film transistor where the electrical double layer gates the device using experiment and theory. We show that the transition between the ON and OFF states of the amorphous indium gallium zinc oxide transistor is accompanied by a densification and preferential spatial orientation of counterions at the oxide channel surface. This process occurs in three distinct steps, corresponding to ion orientations, and consequently, regimes of different electrical conductivity. The reason for this can be found in the surface charge densities on the oxide surface when different ion arrangements are present. Overall, the field-effect gating process is elucidated in terms of the interfacial ionic liquid structure, and this provides unprecedented insight into the working of a liquid gated transistor linking the nanoscopic structure to the functional properties. This knowledge will enable both new ionic liquid design as well as advanced device concepts.