Y.Mitsuya,K.Nakayama,S.Okugawa,E.Nakai: "Head-to-Disk Spacing Measurements in Contact Regime Using Michelson Laser Interferometry Enhanced by Active Sensing and Image Processing"Proc.of the Symposium on Interface Technology Towards 100 Gbit/in2 ASME 1999.
Y.Mitsuya,K.Nakayama,S.Okugawa,E.Nakai: "Head-to-Disk Spacing Measurements in Contact Regime Using Michelson Laser Interferometry Enhanced by Active Sensing and Image Processing"Proc.of the Symposium on Interface Technology Towards 100 Gbit/in2 ASME 1999.
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Y.Mitsuya,K.Nakayama,S.Okukawa,E.Nakai：“利用主动传感和图像处理增强的迈克尔逊激光干涉测量接触方式中的磁头到磁盘间距测量”Proc. of the Symposium on Interface Technology Towards 100 Gbit
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