NO/sub x/ treatment using low-energy secondary emission electron gun
NO/sub x/ treatment using low-energy secondary emission electron gun
复制标题
NO/sub x/低能二次发射电子枪处理
DOI：
10.1109/tps.2004.831594
复制
发表时间：
2004
影响因子：
1.5
通讯作者：
E. Hotta
中科院分区：
文献类型：
--
作者：
P. Chalise;Yu Wang;K.A. Mustafa;M. Watanabe;Y. Hayashi;A. Okino;E. Hotta
紧凑且高效的宽电子束源，能够减少对环境应用要求非常高的各种气态污染物。我们正在开发一种使用线离子等离子体源的离子诱导二次发射电子枪 (SEEG)，用于 NO/sub x/处理等环境应用。 SEEG 提供均匀且大截面的电子束，适合有效减少气态污染物。我们提出了第一份关于 SEEG 在 NO/sub x/ 治疗中的应用的报告。 SEEG对NO/sub x/处理的性能与N/sub 2/中250 ppm NO的去除率和去除效率定量相关。电子束照射在气体处理室（13 L）中进行，其中样品烟气在环境压力和温度下以每分钟 2 至 14 标准升的受控体积流量流动。在各种条件下研究了 NO 去除特性，例如增加枪电压、气体流速和变化的脉冲电子束参数（电流密度和脉冲长度）。在 100 kV 的加速枪电压下，在 60 s 内实现了 20% 的合理 NO 去除率（重复率 = 10 pps，电流密度 = 28 mA/cm/sup 2/，脉冲长度 = 10 /spl mu/s）。以 NO 去除比能量成本表示的 NO 去除效率为 63.15 eV/分子。据观察，脉冲电子束的时间和空间特性对 NO 去除和处理效率有很大影响。我们正在尝试通过减小处理室尺寸并应用许多优化的参数来提高处理效率。
A compact and highly efficient broad electron-beam source that is capable of reducing a wide range of gaseous pollutants that are very much demanding for environmental applications. We are developing an ion-induced secondary-emission electron gun (SEEG) using wire ion-plasma source for environmental applications such as NO/sub x/ treatment. The SEEG offers uniform and large cross section electron beams suitable for the efficient reduction of gaseous pollutants. We present the first report about the application of SEEG on NO/sub x/ treatment. The performance of SEEG on NO/sub x/ treatment is quantitatively related to removal ratio and removal efficiency of 250 ppm of NO in N/sub 2/. The electron-beam irradiation was carried out in a gas treatment chamber (13 L), where the sample flue gas was flown in ambient pressure and temperature at a controlled volumetric flow rate of 2 to 14 standard liters per minute. The NO removal characteristics have been studied under various conditions such as increased gun voltage, gas flow rate, and varied pulsed-electron-beam parameters (current density and pulse length). A reasonable NO removal ratio of 20% was achieved in 60 s (repetition rate = 10 pps, current density = 28 mA/cm/sup 2/, and pulse length = 10 /spl mu/s) at the accelerating gun voltage of 100 kV. The NO removal efficiency expressed in terms of specific energy cost for NO removal is 63.15 eV/molecule. It was observed that temporal and spatial characteristics of pulsed electron beam impose a substantial effect on the NO removal and the processing efficiency. We are trying to increase the processing efficiency by reducing treatment-chamber dimensions and applying a number of well-optimized parameters.