Atomic-Scale Characterization of Nanostructured Metallic Materials by HAADF/Z-contrast STEM
Atomic-Scale Characterization of Nanostructured Metallic Materials by HAADF/Z-contrast STEM
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通过 HAADF/Z 对比 STEM 对纳米结构金属材料进行原子尺度表征
DOI：
10.2320/matertrans.44.2035
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发表时间：
2003
影响因子：
1.2
通讯作者：
E. Abe
中科院分区：
文献类型：
--
作者：
E. Abe
我们证明，高角度环形暗场扫描透射电子显微镜（HAADF-STEM）与finely-focused电子探针（0：15 nm）是非常强大的技术，以提供直接的信息在原子尺度上的纳米材料的局部化学。这是由于HAADF对比度（Z对比度）的原子数（Z）敏感性质。我们描述了一些晶态、准晶和非晶态金属材料的微观结构，并着重于它们的局部化学环境。HAADF-STEM不仅具有化学Z衬度，而且与传统的相衬高分辨率成像相比，具有更丰富的光谱，因此它将成为表征纳米结构材料的最有力的方法之一。关键词：扫描透射电子显微镜，高角度环形暗场成像，原子分辨率Z衬度，局部化学，铝和镁合金
We demonstrate that high-angle annular-dark-field scanning transmission electron microscopy (HAADF-STEM) with a finely-focusedelectron probe( 0:15nm) is very powerful techniqueto provide direct information on a local chemistry of nano-materials at atomicscale. Thisis due to an atomic-number (Z) sensitive nature of the HAADF contrast (Z-contrast). We describe the microstructures of some crystalline,quasicrystalline and amorphous metallic materials with focusing on their local chemical environments. Not only the chemical Z-contrast,HAADF-STEMpossessesmoresubstantialadvantagescomparedtotheconventionalphase-contrasthigh-resolutionimaging,sothatitwouldbeone of the most powerful methods for total characterization of nano-structured materials.(Received April 23, 2003; Accepted June 19, 2003)Keywords: scanning transmission electron microscope, high-angle annular-dark-field imaging, atomic-resolution Z-contrast, local chemistry,aluminium- and magnesium-alloys