Electron Interference Microscope and its Application to the Measurement of Mean Inner Potential
Electron Interference Microscope and its Application to the Measurement of Mean Inner Potential
复制标题
电子干涉显微镜及其在平均内电位测量中的应用
DOI：
10.5940/jcrsj.17.226
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发表时间：
1975
期刊：
影响因子：
--
通讯作者：
K. Yada
中科院分区：
文献类型：
--
作者：
K. Yada
结合电子干涉显微镜不可或缺的电子双棱镜的结构，回顾了电子干涉显微镜的发展。作为电子干涉显微镜的许多可能应用之一，描述了平均内电势的测量。
Development of electron interference microscope is reviewed in relation to the structure of the electron bi-prism, which is indispensable to the instrument. As one of many possible applications of the electron interference microscopy, measurement of mean inner potential is described.