Linear models for optimal test design
Linear models for optimal test design
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用于最佳测试设计的线性模型
DOI：
10.1007/s11336-005-1386-7
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发表时间：
2007
期刊：
影响因子：
3
通讯作者：
Hua
中科院分区：
文献类型：
--
作者：
Hua
这本书的重点是介绍线性规划测试设计和测试组装，特别是根据给定的测试规范自动组装等价的测试表。如今，基于计算机的成绩考试和资格认证考试的大规模应用给考试发展带来了巨大的挑战。这些挑战之一是以多种形式维护内容表示，这是测试防御性和有效性的核心。手工组装并行测试表单不仅耗时，而且当需要大量表单时也是不可行的。另一方面，利用完善的自动化测试组装程序，减少了测试开发人员的工作量，并确保了组装后的测试表的质量。这本优秀的12章书是由一位作者撰写的，读者可以通过阅读多位作者的不同书籍或编辑后的版本来区分不同之处。读者无疑会喜欢章节流畅的连贯性。在每一章之后都有一套精心设计的家庭作业问题，这使得这本书成为考试设计的理想教材和很好的参考书，以及许多课程，如测量理论，项目反应理论，和计算机测试。与许多其他教科书相比，这本书的独特之处在于，作者维姆·范德林登教授在这本书所呈现的内容方面是世界上最好的专家。令人着迷的是，作者引用了他在一流期刊上发表的61篇与测试设计和测试组装有关的研究论文。我相信这本书对于任何对心理测量学研究领域感兴趣的人来说都是一本有价值的参考。范德林登教授坚持不懈地为心理测量学研究领域做出贡献，为我们这个领域的每个人，特别是年轻人树立了榜样。我完全同意罗纳德·汉布尔顿教授的观点，因为范德林登教授的贡献，这个领域变得更加丰富。
The focus of this book is to introduce linear programming to test design and test assembly, particularly, to automatically assembling equivalent test forms according to given test specifications. Today’s large-scale application of computer-based achievement tests and credentialing exams has generated great challenges to test development. One of these challenges, maintaining content representation in multiple forms, is central to test defensibility and validity. Manually assembling parallel test forms is not only time-consuming, but is also infeasible when a great number of forms are needed. Utilizing well-developed automated test assembly procedures, on the other hand, reduces the workload of test developers and ensures the quality of the assembled test forms.This superb 12-chapter book was written by a single author and readers can tell the difference by reading a different book by multiple authors or an edited version. Readers will undoubtedly enjoy the coherence flowing through the chapters. There is a set of well-constructed homework problems after each chapter and this makes the book ideal as a text book in test design and a good reference book, as well for many courses such as measurement theory, item response theory, and computerized testing. In comparison with many other textbooks, what makes this book unique is that the author, Professor Wim van der Linden, is the world’s best expert in the content the book presents. It is so fascinating to note that the author has cited 61 of his research papers relating to test design and test assembly published in top-notch journals. I believe this book is a valuable reference for anyone who is interested in the psychometric research field. Professor van der Linden’s persistent efforts of making contributions to the field of Psychometric Research sets a role model for everyone in our area, especially young people. I would totally agree with Professor Ronald Hambleton that the field is much richer because of Professor van der Linden’s contribution.