An interval-based diagnosis scheme for identifying failing vectors in a scan-BIST environment
An interval-based diagnosis scheme for identifying failing vectors in a scan-BIST environment
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一种基于间隔的诊断方案，用于识别扫描 BIST 环境中的故障向量
DOI：
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发表时间：
2002
期刊：
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通讯作者：
M. Gössel
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作者：
Chunsheng Liu;K. Chakrabarty;M. Gössel
我们提出了一种新的扫描BIST方法来确定故障诊断的失败向量。这种方法是基于应用程序的重叠间隔的测试向量的电路被测。两个MISR（多输入签名寄存器）以交错方式用于生成中间签名，从而避免了对多个测试会话的需要。故障和非故障间隔的知识用于获得包括所有实际（真）故障向量的候选故障向量的集合S。我们提出的分析结果，以确定一个适当的间隔长度和重叠的程度，上界的大小S，和下界的数量上的真正失败的向量;后者只依赖于知识的失败和非失败的间隔。最后，我们描述了两个修剪程序，使我们能够减少S的大小，同时保留最真实的失败向量在S。我们目前的ISCAS 89基准电路的实验结果表明，建议的扫描BIST诊断方法的有效性。
We present a new scan-BIST approach for determining failing vectors for fault diagnosis. This approach is based on the application of overlapping intervals of test vectors to the circuit under test. Two MISRs (multiple-input signature registers) are used in an interleaved fashion to generate intermediate signatures, thereby obviating the need for multiple test sessions. The knowledge of failing and non-failing intervals is used to obtain a set S of candidate failing vectors that includes all the actual (true) failing vectors. We present analytical results to determine an appropriate interval length and the degree of overlap, an upper bound on the size of S, and a lower bound on the number of true failing vectors; the latter depends only on the knowledge of failing and non-failing intervals. Finally, we describe two pruning procedures that allow us to reduce the size of S, while retaining most true failing vectors in S. We present experimental results for the ISCAS 89 benchmark circuits to demonstrate the effectiveness of the proposed scan-BIST diagnosis approach.