Organic carbon at soil particle surfaces - Evidence from X-ray photoelectron spectroscopy and surface abrasion
Organic carbon at soil particle surfaces - Evidence from X-ray photoelectron spectroscopy and surface abrasion
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DOI：
10.2136/sssaj2002.1526
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发表时间：
2002-09-01
影响因子：
2.9
通讯作者：
Sauer, G
中科院分区：
文献类型：
--
作者：
Amelung, W;Kaiser, K;Sauer, G
这项研究旨在研究X射线光电子光谱法（XP）在研究二次土壤颗粒处的土壤有机物的潜力。将XPS应用于典型单倍型（53-MUM最大真实直径）的A地平线的微聚集物，并将其细分为细节（
This study aimed at investigating the potential of x-ray photoelectron spectroscopy (XPS) for investigating soil organic matter at secondary soil particles. The XPS was applied to microaggregates of the A horizon of a Typic Haplustoll (53-mum maximum real diameter) and to the fine-earth fraction (