Origin of photoinduced metastable defects in amorphous chalcogenides.
Origin of photoinduced metastable defects in amorphous chalcogenides.
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DOI:
10.1103/physrevb.46.10062
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发表时间:
1992-10
期刊:
影响因子:
--
通讯作者:
Shimakawa;Inami;Kato;Elliott
中科院分区:
文献类型:
--
作者:
Shimakawa;Inami;Kato;Elliott
Prolonged exposure to band-gap light decreases the photoconductivity of annealed films of amorphous chalcogenides (As&S3, As3S7 AsS, As2Se3, GeS2, GeSe2, and GeSe). This can be attributed to photoinduced metastable defects, which could act as additional trapping and/or recombination centers. These metastable centers are removed by annealing near the glass transition temperature. The kinetics of the temporal change of photocurrent during illumination are discussed in a model of defect-conserved bond switching. I. INTRODUCTION Photoinduced defect creation in amorphous chalcogenides has been studied using light-induced electronspin resonance (LESR), ' xerographic, ' ac transport, and photocurrent ' measurements. A model has been presented in our earlier studies ' for the light-induced creation of metastable deep defect states in stoichiometric amorphous chalcogenides [e.g. , As2S(Se)3, GeS(Se)2]. The reversible time-dependent changes in the photoconductivity caused by optical illumination result from the initial creation of intimate pairs (IP) of charged defects (previously referred to as self-trapped excitons ), followed by bond-switching reactions leading to widely separated, metastable "random pairs" (RP) of defects. In the present paper, through measurements of the temperature-dependent decrease in photocurrent I for stoichiometric amorphous As2S3, As2Se3, GeSz, and GeSe2 films, and off-stoichiometric amorphous As3S7, AsS, and GeSe films, the kinetics of defect-conserved bond-switching (DCBS) reactions are discussed using a potential-energy diagram for IP and RP centers. The kinetics of DCBS may be "dispersive" ' in nature and hence the temporal change in I can be expressed empirically by using the stretched exponential term [exp(Ct )], where 0&1. Fitting to the experimental data produces information about the magnitude of the potential barriers associated with the formation of IP and RP centers. II. PHOTOCONDUCTIVITY STUDIES Thin films of amorphous As2S3, As3S7, AsS, As2Se3, GeS2, GeSe2, and GeSe were evaporated onto Corning 7059 substrates. After evaporation, the samples were annealed at appropriate temperatures below the glasstransition temperature T . The thickness of the films, the annealing temperatures T„and the Tauc gap Eo are given in Table I. The actual compositions of As-S(Se) films were estimated using x-ray photoemission spectroscopy (XPS) measurements and these are shown in parentheses in Table I. Sulfur-rich films compared with the starting glasses were always obtained. Planar gap cell electrodes using Al contacts were fabricated (gap spacing 40 JLtm, gap width 5 mm). The applied voltages were 300 V for S-containing materials and 5 V for Se-containing materials. A halogen lamp (57 mWlcm ), or a highpressure mercury lamp (54 mW/cm ) for wider band-gap matenals, was used with an ir-cut water filter to induce photoconductivity. The type of lamp used in each case is