Planar-type Ferromagnetic Tunnel Junctions Fabricated by Atomic Force Microscope for Nonvolatile Memory
Planar-type Ferromagnetic Tunnel Junctions Fabricated by Atomic Force Microscope for Nonvolatile Memory
复制标题
原子力显微镜制备的非易失性存储器平面型铁磁隧道结
DOI:
10.1143/jjap.40.128
复制
发表时间:
2001
影响因子:
1.5
通讯作者:
J. Shirakashi
中科院分区:
文献类型:
--
作者:
Y. Takemura;J. Shirakashi
A nonvolatile magnetic memory based on a planar-type ferromagnetic single electron transistor is proposed. A sense signal dominated by a co-tunneling current under Coulomb blockade enables a low-power operation of the memory. The small tunnel junctions required for a room temperature operation of the device can be consisted of planar-type tunnel junctions fabricated by a nano-oxidation technique using atomic force microscope.