X-ray microfocussing combined with microfluidics for on-chip X-ray scattering measurements
X-ray microfocussing combined with microfluidics for on-chip X-ray scattering measurements
复制标题
DOI：
10.1039/b517055a
复制
发表时间：
2006-01-01
期刊：
影响因子：
6.1
通讯作者：
Salmon, JB
中科院分区：
文献类型：
--
作者：
Barrett, R;Faucon, M;Salmon, JB
这项工作描述了在Kapton（聚酰亚胺）薄微流体器件的制造。这些芯片非常适合使用强烈的微聚焦光束进行X射线散射实验，因为Kapton对同步加速器产生的高强度具有相对抵抗力，并且对X射线几乎透明。我们展示了使用激光烧蚀Kapton膜获得的微通道网络，并且我们还提出了一种简单的方法来进行两个Kapton膜之间的熔合键合。使用这种设备提供的可能性与X射线散射实验说明。这些实验表明，在1埃-20纳米范围内的结构测量，可以获得空间分辨率为几微米的微通道。
This work describes the fabrication of thin microfluidic devices in Kapton ( polyimide). These chips are well-suited to perform X-ray scattering experiments using intense microfocussed beams, as Kapton is both relatively resistant to the high intensities generated by a synchrotron, and almost transparent to X-rays. We show networks of microchannels obtained using laser ablation of Kapton films, and we also present a simple way to perform fusion bonding between two Kapton films. The possibilities offered using such devices are illustrated with X-ray scattering experiments. These experiments demonstrate that structural measurements in the 1 angstrom-20 nm range can be obtained with spatial resolutions of a few microns in a microchannel.