Trace Analysis by Heavy Ion Induced X-Ray Emission
Trace Analysis by Heavy Ion Induced X-Ray Emission
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DOI：
10.1007/s006040070112
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发表时间：
2000
影响因子：
5.7
通讯作者：
K. Ecker;H. Weise;K. Merkle
中科院分区：
文献类型：
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作者：
K. Ecker;H. Weise;K. Merkle
测量了重离子对ez2 = 13 ~ 83范围内元素的各种K、L和m壳层x射线产生截面。离子种类z1 = 10 ~ 36，离子能量1 ~ 16mev。当弹体K-或L-结合能与靶体K-、L-或m -壳能相似时，观察到截面增强。该效应用于提高选定元素的分析灵敏度。以V、Mn、Co、Ni离子为例，研究了玻璃中铁的痕量分析。结果与同一样品的质子诱导x射线发射分析结果进行了比较。在这些样品中，3 MeV质子和14 MeV Ni离子辐照产生的fe - k - α x射线相似。然而，与质子辐照相比，Ni离子辐照的信号本底比要高4倍。讨论了重离子诱导x射线定量分析与质子诱导x射线定量分析的优缺点。
Various K-, L- and M-shell X-ray production cross sections are measured for heavy ion impact on elements in the rangeZ2= 13 to 83. The ion species range fromZ1= 10 to 36, and ion energies from 1 to 16 MeV are used. Enhanced cross sections are observed when the projectile K- or L- binding energy is similar to the energy of the target K-, L- or M-shell. This effect is used to improve the analysis sensitivity for selected elements. As an example trace analysis of Fe in glass with V, Mn, Co and Ni ions is investigated. Results are compared with proton induced X-ray emission analysis on the same samples. In these samples Fe-KαX-ray production is similar for irradiation with 3 MeV protons and 14 MeV Ni ions. However the signal to background ratio is four times higher for the irradiation with Ni ions as compared to irradiation with protons. Advantages and drawbacks of heavy ion induced X-ray emission for quantitative analysis compared to proton induced X-ray emission analysis are discussed.