Multilayer X-ray optics at CHESS.
Multilayer X-ray optics at CHESS.
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DOI：
10.1107/s0909049506002846
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发表时间：
2006-03
影响因子：
2.5
通讯作者：
A. Kazimirov;Detlef-Matthias Smilgies;Q. Shen;Xianghui Xiao;Q. Hao;E. Fontes;D. Bilderback;S. Gruner;Y. Platonov;V. Martynov
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文献类型：
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作者：
A. Kazimirov;Detlef-Matthias Smilgies;Q. Shen;Xianghui Xiao;Q. Hao;E. Fontes;D. Bilderback;S. Gruner;Y. Platonov;V. Martynov
康奈尔高能同步加速器光源（CHESS）中几乎一半的X射线光束线都是基于多层光学器件。传统的能量分辨率为Δ E/E约2%的多层膜通常用于提供与标准Si（111）光学器件相比增强了10（2）倍的X射线通量。具有固定半径的弧矢聚焦多层膜在通量密度上提供额外的10倍增益。DeltaE/E约为0.2%的高分辨率多层膜光学器件现在被MacCHESS晶体学家常规使用。新的宽带通多层膜的Δ E/E = 5%和10%的设计和测试的潜在应用在大分子晶体学。d <或= 20 A的小d间距多层膜已成功地用于扩展多层膜光学的能量范围。分析了Mo/B_4C和W/B_4C小d间距多层膜光学器件的主要特性，表明它们在更高能量下的性能有所增强。化学气相沉积的SiC具有比硅高两倍的体热导率，已成功地被引入作为多层光学器件的衬底材料。讨论了不同类型的多层膜光学器件在CHESS光束线上的特性及其在各种散射、衍射和成像技术中的应用。
Almost half of the X-ray beamlines at the Cornell High Energy Synchrotron Source (CHESS) are based on multilayer optics. ;Traditional' multilayers with an energy resolution of DeltaE/E approximately 2% are routinely used to deliver X-ray flux enhanced by a factor of 10(2) in comparison with standard Si(111) optics. Sagittal-focusing multilayers with fixed radius provide an additional factor of 10 gain in flux density. High-resolution multilayer optics with DeltaE/E approximately 0.2% are now routinely used by MacCHESS crystallographers. New wide-bandpass multilayers with DeltaE/E = 5% and 10% have been designed and tested for potential applications in macromolecular crystallography. Small d-spacing multilayers with d < or = 20 A have been successfully used to extend the energy range of multilayer optics. Analysis of the main characteristics of the Mo/B4C and W/B4C small d-spacing multilayer optics shows enhancement in their performance at higher energies. Chemical vapour deposited SiC, with a bulk thermal conductivity of a factor of two higher than that of silicon, has been successfully introduced as a substrate material for multilayer optics. Characteristics of different types of multilayer optics at CHESS beamlines and their applications in a variety of scattering, diffraction and imaging techniques are discussed.