A simulation study of the electroluminescence yield of xenon and xenon-neon mixtures contaminated by water vapor
A simulation study of the electroluminescence yield of xenon and xenon-neon mixtures contaminated by water vapor
复制标题
水蒸气污染的氙及氙-氖混合物电致发光产率的模拟研究
DOI：
10.1016/s0168-9002(03)01054-4
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发表时间：
2003
期刊：
影响因子：
--
通讯作者：
A. Stauffer
中科院分区：
文献类型：
--
作者：
F. Santos;T. Dias;L. Tavora;P. Rachinhas;C. Conde;A. Stauffer
稀有气体及其混合物被广泛用作X射线的检测介质，并在液相中用作γ射线的检测介质。在气相中，它们通常用于气体比例电离和比例闪烁探测器。这第二种类型的检测器需要非常高的气体纯度，因为电致发光对分子杂质的存在非常敏感。使用蒙特卡罗模拟再现漂移的电子在惰性气体介质中，我们调查在这项工作中的作用H2O的猝灭的电致发光从氘和Xe-Ne混合物。给出了100和500 ppm H2O浓度的闪烁产率和闪烁阈值的结果。
Noble gases and their mixtures are widely used as detection media for X-rays, and in the liquid phase for γ-rays. In the gas phase, they are commonly used in gas proportional-ionization and proportional-scintillation detectors. This second type of detectors requires exceptionally high gas purity, since electroluminescence is extremely sensitive to the presence of molecular impurities. Using a Monte Carlo simulation which reproduces the drift of electrons in a noble gas medium, we investigate in this work the role of H2O on the quenching of electroluminescence from Xe and Xe–Ne mixtures. Results are presented for the scintillation yields and scintillation thresholds for 100 and 500ppm H2O concentrations.