Electron holography technique for investigating thin ferromagnetic films
Electron holography technique for investigating thin ferromagnetic films
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用于研究铁磁薄膜的电子全息技术
DOI：
10.1103/physrevb.25.6799
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发表时间：
1982
影响因子：
3.7
通讯作者：
H. Fujiwara
中科院分区：
文献类型：
--
作者：
A. Tonomura;T. Matsuda;H. Tanabe;N. Osakabe;J. Endo;A. Fukuhara;Kohsei Shinagawa;H. Fujiwara
本文提出了一种观察铁磁样品中微磁结构的方法。描述了用于形成电子全息图和用于再现光学图像的实验装置。特别注意限制测量精度的因素。该技术被应用到薄铁磁薄膜，用于观察电子相位的等高线图中的磁化强度分布的细节。
A method is presented here for observing micromagnetic structures in ferromagnetic specimens. Experimental apparatuses for forming electron holograms and for reconstructing optical images are described. Special attention is paid to factors limiting measurement precision. The technique is applied to thin ferromagnetic films, for the purpose of observing fine details of magnetization distribution in a contour map of the electron phase.