Tip-modulation scanned gate microscopy
Tip-modulation scanned gate microscopy
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DOI：
10.1021/nl080488i
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发表时间：
2008-08-01
期刊：
影响因子：
10.8
通讯作者：
Cobden, David H.
中科院分区：
文献类型：
--
作者：
Wilson, Neil R.;Cobden, David H.
我们引入了一种提高灵敏度和分辨率并消除扫描门显微镜 (SGM) 的非局部背景的技术。在传统的 SGM 中，向原子力显微镜尖端施加偏压，并在扫描尖端时测量样品电导。在我们称为尖端调制 SGM (tmSGM) 的新技术中，偏置尖端发生振荡，并测量样品电导的感应振荡。应用于单壁碳纳米管网络器件时，tmSGM 可提供清晰、低噪声且无背景的图像。
We introduce a technique that improves the sensitivity and resolution and eliminates the nonlocal background of scanned gate microscopy (SGM). In conventional SGM, a voltage bias is applied to the atomic force microscope tip and the sample conductance is measured as the tip is scanned. In the new technique, which we call tip-modulation SGM (tmSGM), the biased tip is oscillated and the induced oscillation of the sample conductance is measured. Applied to single-walled carbon nanotube network devices, tmSGM gives sharp, low-noise and background-free images.