Optical dispersion study of PPDT2FBT by spectroscopic ellipsometry
Optical dispersion study of PPDT2FBT by spectroscopic ellipsometry
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利用光谱椭圆光度法研究 PPDT2FBT 的光学色散
DOI：
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发表时间：
2020
期刊：
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通讯作者：
M. Y. Chen
中科院分区：
文献类型：
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作者：
C. Howlader;M. Hasan;Alexander Zakidov;M. Y. Chen
近年来，PPDT 2FBT由于在太阳能电池和光电器件中的应用而受到研究者的关注。虽然这种材料的主要应用是基于光学性质。然而，这种材料的光学色散尚未在UV和可见光谱范围内进行研究。我们报告的PPDT 2FBT的光学性质的波长范围为300 nm至900 nm，使用可变角光谱椭圆偏振法（SE）。在室温下测定了旋涂PPDT 2FBT薄膜的折射率（n）和消光系数（k）。为了方便起见，使用已知光学性质的玻璃作为基底。为了建立一个光学模型的表面形态进行了研究，使用原子力显微镜（AFM）。然后根据提取的属性建立光学模型。发现光学性质与UV-Vis数据一致。从吸收特性估计带隙。最后，将建立的椭圆偏振模型用于PPDT 2FBT薄膜的厚度测量。测量数据与使用相同薄膜的其他直接厚度测量技术收集的数据吻合良好。该模型可用于设计有效的光电器件，以及以无损的方式测量薄膜的厚度。
In recent years, PPDT2FBT is getting researchers’ attention due to its applications in solar cells and optoelectronic devices. Although the main applications of this material are based on the optical properties. However, the optical dispersion of this material has not been studied yet over the UV and visible spectral range. We report the optical properties of PPDT2FBT for the wavelength range of 300 nm to 900 nm using a variable angle spectroscopic ellipsometry (SE). The refractive index (n) and extinction coefficient (k) of spin coated PPDT2FBT thin films were determined at room temperature. Glass of known optical properties was used as the substrates for convenience. To build an optical model the surface morphology was studied using atomic force microscopy (AFM). Then an optical model was developed based on the extracted properties. The optical properties were found to be consistent with the UV-Vis data. The bandgap was estimated from the absorption properties. Finally, the developed ellipsometry model was used for thickness measurement of PPDT2FBT thin films. The measured data agreed well with the data collected using other direct thickness measurement techniques of the same thin film. This developed model can be useful for designing effective optoelectronic devices as well as measuring the thickness of thin films in a nondestructive way.