Time‐resolved hard X‐ray magnetic microprobe at SPring‐8
Time‐resolved hard X‐ray magnetic microprobe at SPring‐8
复制标题
SPring-8 的时间分辨硬 X 射线磁微探针
DOI：
10.1063/1.3463157
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发表时间：
2010
期刊：
影响因子：
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通讯作者：
M. Tsunoda
中科院分区：
文献类型：
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作者：
M. Suzuki;N. Kawamura;H. Osawa;M. Takagaki;K. Ono;T. Taniuchi;S. Isogami;M. Tsunoda
在BL39XU上研制了一台空间和时间分辨率为400ps和亚2μm的硬X射线磁强计。该技术基于X射线磁二向色性测量，结合KB聚焦镜和快电流源，产生持续时间为400ps的脉冲磁场，与203束团操作(42 MHz)中存储环提供的X射线脉冲同步，抖动为50ps。充分利用硬X射线二向色性的体敏性和元素特异性，我们证明了在10μm点样品中，NiFe自由层和钉扎CoFeB/CoFe层在纳秒时间尺度上的磁化反转过程被分离，其结构类似于磁隧道结器件。
An instrument for hard X‐ray magnetometry with spatial and time resolutions of 400‐ps and sub‐2‐μm was developed at BL39XU, SPring‐8.The technique is based on X‐ray magnetic circular dichroism measurements combined with KB focusing mirrors and a fast current source, which generates a pulsed magnetic field of 400‐ps duration that is synchronized with the X‐ray pulses provided from the storage ring in the 203‐bunch operation (42 MHz) with a jitter of 50 ps. By fully using the bulk‐sensitivity and element‐specificity of hard X‐ray dichroism, we have demonstrated that the magnetization reversing process in the nanosecond time scale of the free NiFe and pinned CoFeB/CoFe layers were separated in a 10‐μm dot sample with a NiFe/MgO/CoFeB/CoFe/MgO structure mimicking a magnetic tunnel junction device.