Molecular ion yield enhancement in static secondary ion mass spectrometry by soft landing of protonated water clusters
Molecular ion yield enhancement in static secondary ion mass spectrometry by soft landing of protonated water clusters
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DOI：
10.1002/sia.3161
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发表时间：
2011-01-01
影响因子：
1.7
通讯作者：
Cooks, R. Graham
中科院分区：
文献类型：
--
作者：
Li, Guangtao;Cyriac, Jobin;Cooks, R. Graham
使用配备 SIMS 功能的定制软着陆 (SL) 仪器演示了一种在静态二次离子质谱 (SIMS) 中提高分子离子产率的有效在线方法。在质子化水簇 [H(H2O)(n)](+)（n = 4 至 >100）的混合物软着陆后，在二氧化硅基质上观察到氨基酸和肽的分子离子产率显着增强。对半导体和金属基底的图像电流测量和实验证实，分析物分子的质子化和基底上的有效电荷保留是观察到的现象的原因。通过使用 2% 乙酸的甲醇/水溶液电喷雾沉积对表面进行离线处理，也可以观察到增强效果（不太方便）。版权所有 (C) 2010 约翰·威利父子有限公司
An effective online method for molecular ion yield enhancement in static secondary ion mass spectrometry (SIMS) is demonstrated using a custom-built soft landing (SL) instrument equipped with SIMS capabilities. Dramatic molecular ion yield enhancement has been observed for amino acids and peptides on silica substrates after soft landing a mixture of protonated water clusters [H(H2O)(n)](+) (n = 4 to >100). Image current measurements and experiments on semiconducting and metal substrates confirmed that protonation of the analyte molecule and effective charge retention on the substrate is the reason for the observed phenomenon. Enhancement could also be observed-less conveniently-by offline treatment of the surface using electrospray deposition of 2% acetic acid in methanol/water solution. Copyright (C) 2010 John Wiley & Sons, Ltd.