High-throughput synthesis and characterization of Mg1−xCaxO films as a lattice and valence-matched gate dielectric for ZnO based field effect transistors
High-throughput synthesis and characterization of Mg1−xCaxO films as a lattice and valence-matched gate dielectric for ZnO based field effect transistors
复制标题
DOI:
10.1016/j.apsusc.2005.06.040
复制
发表时间:
2006-01
影响因子:
6.7
通讯作者:
J. Nishii;A. Ohtomo;M. Ikeda;Y. Yamada;K. Ohtani;H. Ohno;M. Kawasaki
中科院分区:
文献类型:
--
作者:
J. Nishii;A. Ohtomo;M. Ikeda;Y. Yamada;K. Ohtani;H. Ohno;M. Kawasaki
Using composition-spread technique, we have grown metastable Mg1−xCaxO solid solution films on ZnO layers by pulsed laser deposition. All the films exhibited (111) oriented cubic phase. Despite a large miscibility gap, no phase separation took place at growth temperatures up to 700°C, whereas an optimal growth temperature was found at 400°C in terms of the crystallinity. The composition-spread films were characterized by X-ray diffraction mapping technique. Both lattice parameters and diffraction intensity increased with increasing the CaO composition. The present isovalent heterointerfaces realized the perfect lattice-matching by properly adjusting the CaO composition, leading to particular interest for ZnO based field effect transistors.