Three-dimensional characterization of dendritic microstructures
Three-dimensional characterization of dendritic microstructures
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DOI：
10.1016/s1359-6454(00)00355-4
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发表时间：
2001-03-14
期刊：
影响因子：
9.4
通讯作者：
Voorhees, PW
中科院分区：
文献类型：
--
作者：
Alkemper, J;Voorhees, PW
首次提出了枝晶微观结构的完整表征。枝晶形态是通过新颖的连续切片工艺获得的，该工艺允许以常规方式确定不透明材料的三维微观结构。使用重建的树突，我们确定平均曲率和高斯曲率的空间分布以及这些曲率的概率密度分布。这些测量可以深入了解塑造这些拓扑复杂结构的局部过程，这些结构对于设置许多材料特性至关重要。 (C) 2001 Acta Materialia Inc. 由 Elsevier Science Ltd 出版。保留所有权利。
The first complete characterization of a dendritic microstructure is presented. The dendrite morphology is obtained via a novel serial-sectioning process that allows the three-dimensional microstructure of opaque materials to be determined in a routine manner. Using the reconstructed dendrite we determine the spatial distribution of the mean and Gaussian curvature as well as the probability density distributions of these curvatures. These measurements yield many insights into the local processes that shape these topologically complex structures that are vital in setting many material properties. (C) 2001 Acta Materialia Inc. Published by Elsevier Science Ltd. All rights reserved.