Interface analysis and compositional depth profiling by XPS of polymer coatings prepared using ultra‐low‐angle microtomy
Interface analysis and compositional depth profiling by XPS of polymer coatings prepared using ultra‐low‐angle microtomy
复制标题
通过 XPS 对超低角度切片制备的聚合物涂层进行界面分析和成分深度分析
DOI：
10.1002/sia.1830
复制
发表时间：
2004
影响因子：
1.7
通讯作者：
C. Lowe
中科院分区：
文献类型：
--
作者：
S. Hinder;J. Watts;C. Lowe
传统的旋转切片机与高精度、超低角度切片模块相结合，已用于在聚合物涂层系统中生产横截面、超低角度锥度。通过超低角度切片 (ULAM) 生产的锥形样品已用于研究多层聚合物涂层中的层间粘合界面以及聚合物/聚合物 + 添加剂系统的成分深度分析。
Conventional rotary microtomy in combination with high‐precision, ultra‐low‐angle sectioning blocks have been used to produce cross‐sectional, ultra‐low‐angle tapers in polymeric coating systems. Tapered samples produced by ultra‐low‐angle microtomy (ULAM) have been employed in the investigation of intercoat bonding interfaces in multilayer polymeric coatings and for the compositional depth profiling of polymer/polymer + additives systems.