Effect of Temperature on the Die Shear Strength of a Au-Sn SLID Bond
Effect of Temperature on the Die Shear Strength of a Au-Sn SLID Bond
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DOI:
10.1007/s11661-013-1725-8
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发表时间:
2013-07-01
影响因子:
2.8
通讯作者:
Larsson, Andreas
中科院分区:
文献类型:
--
作者:
Tollefsen, Torleif Andre;Lovvik, Ole Martin;Larsson, Andreas
The effect of temperature on the die shear strength of a optimized Au-Sn solid-liquid interdiffusion SLID bond, a reliable high temperature die attach and interconnect technology, was investigated. The shear strength was greatly reduced with temperature from 140 MPa at room temperature to 20 MPa at 573 K (300 A degrees C). This reduction was unexpected since the melting point of a Au-Sn SLID bond is 795 K (522 A degrees C). Fractographic studies revealed a change in fracture mode with increasing temperatures. This work emphasizes the importance of performing bond strength quantification at the intended application temperature.