SUBSHELL PHOTOIONIZATION OF XE BETWEEN 40 AND 1000EV
SUBSHELL PHOTOIONIZATION OF XE BETWEEN 40 AND 1000EV
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DOI：
10.1103/physreva.39.3902
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发表时间：
1989-04-15
影响因子：
2.9
通讯作者：
HAYAISHI, T
中科院分区：
文献类型：
--
作者：
BECKER, U;SZOSTAK, D;HAYAISHI, T
部分截面和角分布的不对称参数进行了测量氙的光子能量在40和1000 eV之间的子壳光电离。这些大规模的测量表明，显着的通道间耦合的价和4d电子之间的持续超出4d形状共振在随后的库珀最小区域。与4d和4p光电发射的多电子过程直接测量的第一次在一个更广泛的能量范围内覆盖的近阈值行为的突然限制。将我们的实验结果与基于单粒子模型的计算结果进行比较表明，该理论未能描述中间能量范围，甚至定性地描述价电子，但在更高的光子能量下，特别是超过3d阈值时，该理论给出了与实验合理一致的部分截面。角分布不对称性参数β也显示了相同的结果，除了4p次壳层的光电离更像4d电子的行为，证实了这两个次壳层之间的核-孔涨落的理论假设。在形状共振区，所给出的四维截面与最近用多体微扰理论得到的理论结果是一致的。
Partial cross sections and angular-distribution asymmetry parameters were measured for subshell photoionization of xenon for photon energies between 40 and 1000 eV. These large-scale measurements show that the pronounced interchannel coupling between the valence and the 4d electrons persists beyond the 4d shape resonance in the subsequent Cooper-minimum region. Multielectron processes associated with 4d and 4p photoemission were measured directly for the first time over a broader energy range covering the near-threshold behavior up to the sudden limit. Comparing our experimental results with calculations based on the single-particle model shows that this theory, which fails to describe the intermediate energy range even qualitatively for the valence electrons, gives partial cross sections in reasonable agreement with experiment at higher photon energies, particularly beyond the 3d threshold. The same result is shown by the angular-distribution asymmetry parameter β, except for the photoionization of the ‘‘4p’’subshell which resembles more the behavior of a 4d electron, corroborating the theoretical assumptions of core-hole fluctuations between these two subshells. In the shape resonance region the presented 4d partial cross sections are in reasonable agreement with theoretical results obtained recently by many-body perturbation theory.