Fast Approximate Inversion of Tem Data
Fast Approximate Inversion of Tem Data
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DOI：
10.1071/eg997317
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发表时间：
1997-09
影响因子：
0.9
通讯作者：
E. Stolz;J. Macnae
中科院分区：
文献类型：
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作者：
E. Stolz;J. Macnae
将TEM数据转换为理想的系统响应可以消除与实际波形的特征和缺陷相关的解释问题。它还允许电感和电阻…
Converting TEM data to an ideal system response removes interpretational problems associated with the characteristics and imperfections of practical waveforms. It also allows the inductive and resi...