Irradiation behavior and recovery effect of ferroelectric properties of PZT thin filmsast
Irradiation behavior and recovery effect of ferroelectric properties of PZT thin filmsast
复制标题
PZT薄膜的辐照行为及铁电性能恢复效果
DOI：
10.1088/1674-1056/ac0dad
复制
发表时间：
2021
影响因子：
1.7
通讯作者：
Wei-Dong Fei
中科院分区：
文献类型：
--
作者：
Yu Zhao;Wen-Yue Zhao;Dan-Dan Ju;Yue-Yue Yao;Hao Wang;Cheng-Yue Sun;Ya-Zhou Peng;Yi-Yong Wu;Wei-Dong Fei
锆钛酸铅压电陶瓷在空间和航空航天技术中具有重要的应用，但带电粒子辐射对其性能的影响及其物理机制尚未阐明。在这项研究中，我们的特点是PbZr0.52Ti0.48O3（PZT）薄膜，并在电子和质子辐照前后的薄膜的铁电性能的变化进行了研究。研究了PZT薄膜铁电性能的自然恢复和热处理恢复，以及不同类型的辐射对PZT薄膜的损伤和机理。结果表明，除了电离损伤外，电子辐照对PZT薄膜也造成了一定的结构损伤，质子辐照造成的较大结构损伤使PZT薄膜的铁电性显著降低。
Lead zirconate titanate piezoelectric ceramics have important applications in space and aerospace technology, but the effect and physical mechanism of charged particle radiation on their performance yet to be clarified. In this study, we characterized PbZr 0.52 Ti 0.48 O 3 (PZT) thin films, and changes in the ferroelectric properties of the films before and after electron and proton irradiation were investigated. The natural and heat treatment recoverability of the ferroelectric properties were studied, and the damages and mechanisms of different types of radiation in PZT films were also investigated. The results show that, in addition to ionization damages, electron irradiation causes certain structural damage on the PZT film, and the large structural damage caused by proton irradiation reduces drastically the ferroelectricity of the PZT film.