Non-destructive elemental depth-profiling with muonic X-rays
Non-destructive elemental depth-profiling with muonic X-rays
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DOI：
10.1007/s10967-008-1610-x
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发表时间：
2008-12-01
影响因子：
1.6
通讯作者：
Nishiyama, K.
中科院分区：
文献类型：
--
作者：
Kubo, M. K.;Moriyama, H.;Nishiyama, K.
提出了一种利用μ子X射线进行元素分析的方法。应用负μ子的独特特性，这种方法能够三维地、非破坏性地获得物体中的元素分布。特别地，通过选择入射μ子束能量，可以通过检测携带捕获μ子的原子的信息的高能μ子X射线来实现从表面深至几cm的深度剖析。我们得到了一些初步的结果，并显示了该技术在未来的分析设施的适用性。
An elemental analysis method using muonic X-rays has been developed. Applying the unique features of the negative muon, this method enables elemental distribution in an object to be obtained three dimensionally and non-destructively. Especially, by choosing the incident muon beam energy, depth-profiling as deep as several cm from the surface can be achieved by detecting the high energy muonic X-rays carrying the information of the atom which captured the muon. We obtained some preliminary results and showed the applicability of the technique in future analytical facilities.