Measurements of wavelength-dependent double photoelectron emission from single photons in VUV-sensitive photomultiplier tubes

Measurements of wavelength-dependent double photoelectron emission from single photons in VUV-sensitive photomultiplier tubes
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真空紫外敏感光电倍增管中单光子的波长相关双光电子发射测量

DOI:
10.1088/1748-0221/10/09/p09010
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发表时间:
2015
影响因子:
1.3
通讯作者:
R. Gaitskell
R. Gaitskell
中科院分区:
工程技术4区
文献类型:
--
作者:
C. Faham;V. Gehman;A. Currie;A. Dobi;P. Sorensen;R. Gaitskell

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测量的双光电子发射(DPE)的概率作为波长的函数的报告滨松R8778,R8520,和R11410 VUV敏感的光电倍增管(PMT)。在DPE中,单个光子撞击PMT光电阴极并产生两个光电子而不是单个光电子。发现导致DPE发射的检测到的光子的分数是入射光子波长的函数,并且在低于10250 nm时表现出自身。对于175 nm的氙闪烁波长,根据管和测量方法测得的DPE概率为18-24%。这种依赖于波长的单光子响应对当前和未来的液体氙探测器(如LUX,LZ,XENON 100/1 T,Panda-X和XMASS)的能量校准和光子计数具有影响。
Measurements of double photoelectron emission (DPE) probabilities as a function of wavelength are reported for Hamamatsu R8778, R8520, and R11410 VUV-sensitive photomultiplier tubes (PMTs). In DPE, a single photon strikes the PMT photocathode and produces two photoelectrons instead of a single one. It was found that the fraction of detected photons that result in DPE emission is a function of the incident photon wavelength, and manifests itself below ∼250 nm. For the xenon scintillation wavelength of 175 nm, a DPE probability of 18–24% was measured depending on the tube and measurement method. This wavelength-dependent single photon response has implications for the energy calibration and photon counting of current and future liquid xenon detectors such as LUX, LZ, XENON100/1T, Panda-X and XMASS.
凯尔迪什非平衡格林函数和费什巴赫投影算子技术内的单电子或双电子发射
DOI: 10.1103/physrevb.91.155116
发表时间: 2015
期刊: Physical Review B
影响因子: 3.7
作者:
Y. Pavlyukh;M. Schüler;J. Berakdar
通讯作者: J. Berakdar
光电倍增管阵列的校准
DOI: 10.1016/j.astropartphys.2009.10.004
发表时间: 2010
影响因子: 3.5
作者:
Neves F
通讯作者: Neves F