Soft matter interfaces beamline at NSLS-II: geometrical ray-tracing vs. wavefront propagation simulations

Soft matter interfaces beamline at NSLS-II: geometrical ray-tracing vs. wavefront propagation simulations
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NSLS-II 的软物质界面光束线：几何射线追踪与波前传播模拟

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发表时间：
2014
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影响因子：
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通讯作者：
E. DiMasi
E. DiMasi
中科院分区：
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文献类型：
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作者：
M. Zhernenkov;N. Canestrari;O. Chubar;E. DiMasi

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我们报告了软物质界面光束线设计的意义，这是一种在真空中倾斜的长能量范围 波荡器（IVU）光束线在国家同步辐射光源II，基于比较几何光线追迹和 部分相干X射线波前传播模拟软件包，即SHADOW和Synchrotron 辐射研讨会（SRW）。对于SHADOW，我们使用了一个SRW生成的源文件，该文件模拟了光谱角 2.8m长、23mm周期IVU辐射的分布和视源特性 并且允许我们实际地估计样本位置处的光束强度。我们强调使用 与“标准”内置SHADOW表面误差相反，具有预期斜率误差的真实镜面轮廓 选项.在三种不同的X射线光子能量：20358 eV，10778 eV和2101 eV下， 不同的聚焦条件，进行了研究。我们比较了两个软件进行的光束线模拟 包装件.特别强调了几何光线追迹法中忽略波前衍射效应的重要性 导致束斑尺寸和束形状的显著差异， 确定工具的未来性能。
We report on the implications of the design of a Soft Matter Interfaces beamline, a long energy range canted in-vacuum undulator (IVU) beamline at National Synchrotron Light Source II, based on comparison of geometrical ray-tracing and partially coherent x-ray wavefront propagation simulation software packages, namely, SHADOW and Synchrotron Radiation Workshop (SRW). For SHADOW, we employed an SRW-generated source file which simulated spectralangular distribution and apparent source characteristics of radiation produced by a 2.8 m long IVU with a 23 mm period and allowed us to realistically estimate the beam intensity at the sample positions. We highlight the necessity to use realistic mirror surface profiles with expected slope errors as opposed to “standard” built-in SHADOW surface error options. The beamline performances at three different x-ray photon energies: 20358 eV, 10778 eV, and 2101 eV, under different focusing conditions, have been studied. We compare beamline simulations performed with both software packages. In particular, we stress that the neglect of wavefront diffraction effects in geometrical ray-tracing approach results in significant discrepancies in beam spot size and beam shape, the correct assessments of which are crucial in determining the future performance of an instrument.