Tip cooling effect and failure mechanism of field-emitting carbon nanotubes.
Tip cooling effect and failure mechanism of field-emitting carbon nanotubes.
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DOI：
10.1021/nl061982u
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发表时间：
2006-12
期刊：
影响因子：
10.8
通讯作者：
Wei Wei-Wei;Yang Liu;Yang Wei;K. Jiang;Lianmao Peng;S. Fan
中科院分区：
文献类型：
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作者：
Wei Wei-Wei;Yang Liu;Yang Wei;K. Jiang;Lianmao Peng;S. Fan
本文研究了单根碳纳米管作为场发射电子源时，伴随场发射的冷却效应。提出并验证了场发射碳纳米管失效机理的改进模型。我们的模型预测的最高温度（Tmax）位于一个内部点，而不是尖端的碳纳米管，和CNT发射器的故障往往发生在Tmax点，诱导一段段的击穿过程。焦耳加热和静电力效应的组合，提出负责启动场发射碳纳米管的故障，并验证了现场FE观察。
The cooling effect accompanying field electron emission has been considered for a single carbon nanotube (CNT) used as a field emission (FE) electron source. An improved model for the failure mechanism of field emitting CNTs has been proposed and validated. Our model predicts a maximum temperature (T-max) located at an interior point rather than the tip of the CNTs, and the failure of the CNT emitters tends to take place at the T-max point, inducing a segment by segment breakdown process. A combination of Joule heating and electrostatic force effect is proposed responsible for initiating the failure of the field emitting CNT and validated by in situ FE observation.