Comparison of Computer Simulations with Measurements From a-Si:H Imaging Arrays.
Comparison of Computer Simulations with Measurements From a-Si:H Imaging Arrays.
复制标题
计算机模拟与 a-Si:H 成像阵列测量值的比较。
DOI：
--
复制
发表时间：
1992
期刊：
影响因子：
--
通讯作者：
R. Street
中科院分区：
文献类型：
--
作者：
J. Yorkston;L. Antonuk;N. Seraji;J. Boudry;W. Huanga;E. Morton;R. Street
用于放射治疗和诊断放射学成像应用的平板 a-Si:H 阵列的设计和表征已经开始。未来设计和性能的改进将在很大程度上依赖于能够准确预测阵列在各种操作条件下的行为的计算机模拟结果。这些结果将允许新阵列的设计在投入制造之前针对特定应用进行优化。本文概述了使用对 a-Si:H 器件操作进行建模的仿真代码对改变多个阵列参数和操作条件的影响进行的调查结果。结果与 Xerox PARC 制造的阵列的实际测量结果进行了比较。
The design and characterization of flat panel a-Si:H arrays for imaging applications in radiotherapy and diagnostic radiology has already begun. Future improvements in design and performance will be heavily reliant on the results of computer simulations capable of accurately predicting the behavior of the arrays in a variety of operating conditions. These results will allow the design of new arrays to be optimized for the particular application before they are committed to fabrication. This paper outlines the results of an investigation into the effects of varying a number of array parameters and operating conditions using a simulation code which models the operation of a-Si:H devices. The results are compared with actual measurements from arrays fabricated at Xerox PARC.