A Battery-Assisted Passive EPC Gen-2 RFID Sensor Tag IC With Efficient Battery Power Management and RF Energy Harvesting

A Battery-Assisted Passive EPC Gen-2 RFID Sensor Tag IC With Efficient Battery Power Management and RF Energy Harvesting
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DOI:
10.1109/tie.2016.2585463
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发表时间:
2016-11-01
影响因子:
7.7
通讯作者:
Lee, Jong-Wook
Lee, Jong-Wook
中科院分区:
计算机科学1区
文献类型:
--
作者:
Vinh-Hao Duong;Nguyen Xuan Hieu;Lee, Jong-Wook

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在此,我们提出了一种具有高效电源管理的完全集成的电子产品代码(EPC)Gen-2兼容的电池辅助无源(BAP)射频识别传感器标签集成电路(IC)。标签IC的关键组件包括自适应射频(RF)能量采集器、电池访问控制器(BAC)、存储电容器充电器和电源门控传感器模块。使用动态控制的整流级和阈值补偿技术有效地收集外部RF能量。BAC严格控制电源路径,切断电池泄漏电流。功率门控传感器块以功率高效的方式支持多路复用感测操作。传感器接口包括斩波放大器、可编程增益放大器、多路复用器和8位ADC。对于感测数据记录,通过一次性可编程存储器采用定制设计的非易失性存储器。数字控制模块基于EPCglobal Gen-2标准,该标准经过修改以支持传感操作。标签芯片是在1-poly 6-metal标准0.18 μ m标准CMOS工艺中制造的。标签IC消耗1 μ A用于泄漏和有源操作(0.1%占空比),并且BAP标签IC的估计寿命约为0.2年/mA. h。
Herein, we present a fully integrated electronic product code (EPC) Gen-2 compatible battery-assisted passive (BAP) radio-frequency identification sensor tag integrated circuit (IC) with efficient power management. The key components of the tag IC include an adaptive radio-frequency (RF) energy harvester, a battery access controller (BAC), a storage capacitor charger, and a power-gated sensor block. External RF energy is efficiently harvested using dynamically controlled rectifying stages and a threshold-compensation technique. The BAC tightly controls the power path, cutting off leakage current from the battery. The power-gated sensor block supports multiplexed sensing operations in a power efficient manner. The sensor interface includes a chopper amplifier, a programmable gain amplifier, multiplexers, and an 8-bit ADC. For sensing data logging, custom designed nonvolatile memory is employed via one-time programmable memory. The digital control block is based on an EPCglobal Gen-2 standard that is modified to support the sensing operation. The tag chip was fabricated in a 1-poly 6-metal standard 0.18-mu m standard CMOS process. The tag IC consumes 1 mu A for leakage and active operation (0.1% duty), and the estimated lifespan of the BAP tag IC is about 0.2 year/mA.h.