Principle of surface charge measurement for thick insulating specimens
Principle of surface charge measurement for thick insulating specimens
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DOI：
10.1109/94.708264
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发表时间：
1998-08-01
影响因子：
3.1
通讯作者：
Kawamoto, T
中科院分区：
文献类型：
--
作者：
Takuma, T;Yashima, M;Kawamoto, T
我们讨论测量固体电介质（绝缘样品）表面累积的表面电荷密度的方法，例如气体和真空绝缘设备中的支撑垫片。对于如此厚的样品，探头响应与探头正下方的电荷密度并不对应，因此测量需要多点数据以及数值场计算的帮助。探针响应表面电荷而给出感应电荷或浮动电位。我们比较了以前提出的各种技术，并给出了分析数据的合理程序。
We discuss the method for measuring surface charge density accumulated on the surface of a solid dielectric (insulating specimen) such as a supporting spacer in gas and vacuum insulated equipment. For such thick specimens, the probe response does not correspond to the charge density directly below the probe, so the measurement necessitates multipoint data together with the aid of numerical field calculations. The probe gives either induced charge or floating potential in response to the surface charge. We compare various previously proposed techniques and give a reasonable procedure for analyzing the data.