Solid-phase direct write (SPDW) of carbon via scanning force microscopy.
Solid-phase direct write (SPDW) of carbon via scanning force microscopy.
复制标题
通过扫描力显微镜对碳进行固相直写（SPDW）。
DOI：
10.1021/nl070257w
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发表时间：
2007
期刊：
影响因子：
10.8
通讯作者：
Smith,RosemaryL
中科院分区：
文献类型：
--
作者：
Spinney,PatrickS;Collins,ScottD;Smith,RosemaryL
描述了用扫描力显微镜直接写入制备碳纳米结构的方法。一个导电的原子力尖端被用来收集碳从玻璃碳基板和再沉积到金薄膜下的电压控制。用原子力显微镜和俄歇电子能谱仪检查所产生的图案。碳线的宽度小至40 nm的写入演示。
The fabrication of carbon nanostructures by direct writing with a scanning force microscope is described. A conductive atomic force tip is used to collect carbon from a glassy carbon substrate and redeposit it onto a gold thin film under voltage control. The resulting patterns are examined with atomic force microscopy and Auger electron spectrometry. Writing of carbon lines with widths as small as 40 nm is demonstrated.