Correlating Atom Probe Crystallographic Measurements with Transmission Kikuchi Diffraction Data
Correlating Atom Probe Crystallographic Measurements with Transmission Kikuchi Diffraction Data
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DOI：
10.1017/s1431927616012605
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发表时间：
2017-04-01
影响因子：
2.8
通讯作者：
Ringer, Simon P.
中科院分区：
文献类型：
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作者：
Breen, Andrew J.;Babinsky, Katharina;Ringer, Simon P.
相关显微镜方法为许多研究问题提供了协同解决方案。一个这样的组合，已经研究了有限的细节，是使用原子探针断层扫描（APT）和透射菊池衍射（TKD）在同一尖端样品。通过结合这两种强大的显微技术，可以更详细地研究重要工程合金的微观结构。这是第一次，使用APT进行的晶体学测量的准确性将通过TKD独立验证。将两个原子探针的实验数据进行比较，一个是在直线飞行路径原子探针上收集的纳米晶Al-0.5Ag合金样品，另一个是在安装反射仪上收集的高纯度Mo样品。我们发现，用两种不同的极组合校准原子探针重建计算的平均最小取向角与TKD结果分别偏离0.7度和1.4度。原子探针的类型和实验条件似乎对这种精度有一定的影响，重建和测量程序可能会进一步导致角分辨率的下降。还将讨论这种相关方法的挑战和影响。
Correlative microscopy approaches offer synergistic solutions to many research problems. One such combination, that has been studied in limited detail, is the use of atom probe tomography (APT) and transmission Kikuchi diffraction (TKD) on the same tip specimen. By combining these two powerful microscopy techniques, the microstructure of important engineering alloys can be studied in greater detail. For the first time, the accuracy of crystallographic measurements made using APT will be independently verified using TKD. Experimental data from two atom probe tips, one a nanocrystalline Al-0.5Ag alloy specimen collected on a straight flight-path atom probe and the other a high purity Mo specimen collected on a reflectron-fitted instrument, will be compared. We find that the average minimum misorientation angle, calculated from calibrated atom probe reconstructions with two different pole combinations, deviate 0.7 degrees and 1.4 degrees, respectively, from the TKD results. The type of atom probe and experimental conditions appear to have some impact on this accuracy and the reconstruction and measurement procedures are likely to contribute further to degradation in angular resolution. The challenges and implications of this correlative approach will also be discussed.