Finite Element Analysis of Microscopic Piezo-Electroelastic Behavior Based on Crystallographic Homogenization Method
Finite Element Analysis of Microscopic Piezo-Electroelastic Behavior Based on Crystallographic Homogenization Method
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基于晶体均匀化方法的微观压电弹性行为有限元分析
DOI：
10.1299/kikaia.69.1284
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发表时间：
2003
期刊：
影响因子：
--
通讯作者：
E. Nakamachi
中科院分区：
文献类型：
--
作者：
Y. Uetsuji;Yukihiro Nakamura;S. Ueda;E. Nakamachi
由于多晶压电材料的晶格具有很强的各向异性，其晶体取向分布对其性能有很大的影响。在我们之前的研究中，已经提出了一个基于晶体学均匀化方法的多尺度有限元分析程序来预测宏观压电性能。它可以分析微观行为，保持与宏观响应的兼容性。在这项研究中，压电材料的宏观均匀的机械/电气负载下的微观行为进行了分析。首先，用统计方法计算了多晶体的微观压电弹性响应。然后，用对称点图法（SDP）对这些非均匀行为进行了表征。最后，这些多尺度表征方法的有效性进行了确认。
Property of polycrystalline piezoelectric material is strongly affected by its crystal orientation distribution, because the crystal lattice has a strong anisotropy. In our previous study, a multi-scale finite element analysis code based on crystallographic homogenization method has been proposed to predict macroscopic piezoelectric properties. It can analyze the microscopic behavior in keeping a compatibility with the macroscopic response. In this study, the microscopic behaviors of piezoelectric materials under macroscopic uniform mechanical/electrical loading were analyzed. At first, the microscopic piezo-electroelastic responses of polycrystals are evaluated by employing the statistical procedure. Next, those heterogeneous behaviors were characterized by symmetrized dot pattern (SDP) method. Finally, the availability of these multi-scale characterization methods were confirmed.