FPGA implementation of microcode-based and FSM-based memory built-in self test controllers
FPGA implementation of microcode-based and FSM-based memory built-in self test controllers
复制标题
基于微码和基于 FSM 的存储器内置自测试控制器的 FPGA 实现
DOI：
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发表时间：
2008
期刊：
影响因子：
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通讯作者：
A. Aziz
中科院分区：
文献类型：
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作者：
N. Haron;M. M. Ibrahim;S. Mat;A. Aziz
介绍了一种基于Xilinx Spartan XC 3S 500 E FPGA的基于微码和基于FSM的存储器内建自测试（BIST）控制器的设计与实现。这些控制器采用超高速集成电路硬件描述语言（VHDL）代码编写，并使用Xilinx伊势设计工具进行验证。基于March C-、March C和March X、MATS+和MATS测试模式算法，在现场可编程逻辑阵列（FPGA）器件上进行了多种存储器尺寸测试时的综合与实现。逻辑面积利用率和灵活性的两个控制器进行了评估。我们表明，基于微码的控制器具有更好的灵活性，但占用更大的逻辑面积相比，基于FSM的控制器。
This paper presents the design and implementation of a microcode-based and an FSM-based memory built-in self test (BIST) controllers using Xilinx Spartan XC3S500E FPGA. The controllers are written in Very High Speed Integrated Circuit Hardware Description Language (VHDL) code and verified using Xilinx ISE design tools. Synthesis and implementation on the field programmable logic array (FPGA) device when testing several memory sizes are carried out based on March C-, March C and March X, MATS+ and MATS test pattern algorithms. Logic area utilization and flexibility of the two controllers are evaluated. We show that the microcode-based controller has better flexibility but occupies larger logic area compared to the FSM-based controller.