BETA-LIMIT OF RESISTIVE PLASMA IN A HELIOTRON
BETA-LIMIT OF RESISTIVE PLASMA IN A HELIOTRON
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DOI：
10.1063/1.860132
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发表时间：
1992-09-01
期刊：
影响因子：
--
通讯作者：
ITOH, SI
中科院分区：
文献类型：
--
作者：
ITOH, K;ICHIGUCHI, K;ITOH, SI
研究了日光管器件中交换模式的稳定性，同时考虑了电阻率、电流扩散率、离子粘度和热扩散率的影响。低模数稳定性的临界 beta 存在于有限 beta 值处。对于本实验的等离子体参数范围，电阻模式和电流扩散模式设定了相当的临界β值，这与实验观察结果一致。在未来的高温等离子体中，电流扩散模式对于确定全局模式的稳定性极限可能很重要。
Stability against the interchange mode in heliotron devices is investigated, taking into account the effects of the resistivity, current diffusivity, ion viscosity, and thermal diffusivity. Critical beta for the low-mode-number stability is found at the finite beta value. For the range of plasma parameters of the present experiments, the resistive mode and current diffusive mode set comparable critical beta values, which are consistent with experimental observations. In future high-temperature plasmas, the current-diffusive mode could be important in determining the stability limit for the global mode.