A new approach to variational problems with multiple scales
A new approach to variational problems with multiple scales
复制标题
解决多尺度变分问题的新方法
DOI:
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发表时间:
2001
期刊:
影响因子:
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通讯作者:
S. Müller
中科院分区:
文献类型:
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作者:
G. Alberti;S. Müller
We introduce a new concept, the Young measure on micropatterns, to study singularly perturbed variational problems that lead to multiple small scales depending on a small parameter ε. This allows one to extract, in the limit ε → 0, the relevant information at the macroscopic scale as well as the coarsest microscopic scale (say εα) and to eliminate all finer scales.